Quality improvement program addressed to M.O.S. microprocessors
The net result of this program resulted in the first generation of automotive microprocessors which achieved a 0.095% failure rate in the first year of production, compared with the early > 1.3% rate for the first year of the TMS 1000.
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| Veröffentlicht in: | Microelectronics and reliability 1982, Vol.22 (2), p.207-216 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The net result of this program resulted in the first generation of automotive microprocessors which achieved a 0.095% failure rate in the first year of production, compared with the early > 1.3% rate for the first year of the TMS 1000. |
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| ISSN: | 0026-2714 1872-941X |
| DOI: | 10.1016/0026-2714(82)90179-2 |