Optical probing technique for inhomogeneous superconducting films

We report a nondestructive optical probing technique for superconducting films, by which a cross-sectional gradient of the local transition temperature Tc and a two-dimensional map of the local critical current Ic of an Al film were obtained. The two-dimensional map clearly shows a variety of defect...

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Veröffentlicht in:	Appl. Phys. Lett.; (United States) 1982-03, Vol.40 (5), p.437-439
Hauptverfasser:	Chi, C. C., Loy, M. M. T., Cronemeyer, D. C.
Format:	Artikel
Sprache:	eng
Schlagworte:	360104 - Metals & Alloys- Physical Properties 656102 - Solid State Physics- Superconductivity- Acoustic, Electronic, Magnetic, Optical, & Thermal Phenomena- (-1987) ALUMINIUM CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CRITICAL CURRENT CURRENTS DISTRIBUTION ELECTRIC CURRENTS ELEMENTS MATERIALS SCIENCE MATERIALS TESTING METALS NONDESTRUCTIVE TESTING PHYSICAL PROPERTIES SPATIAL DISTRIBUTION SUPERCONDUCTING FILMS TESTING THERMODYNAMIC PROPERTIES TRANSITION TEMPERATURE
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Beschreibung
Zusammenfassung:	We report a nondestructive optical probing technique for superconducting films, by which a cross-sectional gradient of the local transition temperature Tc and a two-dimensional map of the local critical current Ic of an Al film were obtained. The two-dimensional map clearly shows a variety of defects of the Al film. Some of them can be correlated to visible pinholes.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.93099