Optical behaviour of melting for a thin metal film
Reflectance measurements have been performed for gallium films at normal incidence (from 0.3 to 0.9 μm) in terms of temperature (from -20°C to + 40°C). The basic results are: (i) a drastic change in reflectance when melting occurs (about 20% at 0.6 μm), and (ii) a shift in the temperature of the sol...
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| Veröffentlicht in: | Solid state communications 1982-01, Vol.44 (12), p.1583-1584 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | Reflectance measurements have been performed for gallium films at normal incidence (from 0.3 to 0.9 μm) in terms of temperature (from -20°C to + 40°C). The basic results are: (i) a drastic change in reflectance when melting occurs (about 20% at 0.6 μm), and (ii) a shift in the temperature of the solid-liquid transition with the thickness of the film which only takes place on and after the second melting (about 7°C for a film 250A˚thick). |
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| ISSN: | 0038-1098 1879-2766 |
| DOI: | 10.1016/0038-1098(82)90683-4 |