Bubble-Free Transfer Technique for High-Quality Graphene/Hexagonal Boron Nitride van der Waals Heterostructures

Bubbles at the interface of two-dimensional layered materials in van der Waals heterostructures cause deterioration in the quality of materials, thereby limiting the size and design of devices. In this paper, we report a simple all-dry transfer technique, with which the bubble formation can be avoid...

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Veröffentlicht in:ACS applied materials & interfaces 2020-02, Vol.12 (7), p.8533-8538
Hauptverfasser: Iwasaki, Takuya, Endo, Kosuke, Watanabe, Eiichiro, Tsuya, Daiju, Morita, Yoshifumi, Nakaharai, Shu, Noguchi, Yutaka, Wakayama, Yutaka, Watanabe, Kenji, Taniguchi, Takashi, Moriyama, Satoshi
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Sprache:eng
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Zusammenfassung:Bubbles at the interface of two-dimensional layered materials in van der Waals heterostructures cause deterioration in the quality of materials, thereby limiting the size and design of devices. In this paper, we report a simple all-dry transfer technique, with which the bubble formation can be avoided. As a key factor in the technique, a contact angle between a picked-up flake on a viscoelastic polymer stamp and another flake on a substrate was introduced by protrusion at the stamp surface. Using this technique, we demonstrated the fabrication of high-quality devices on the basis of graphene/hexagonal boron nitride heterostructures with a large bubble-free region. Additionally, the technique can be used to remove unnecessary flakes on a substrate under an optical microscopic scale. Most importantly, it improves the yield and throughput for the fabrication process of high-quality van der Waals heterostructure-based devices.
ISSN:1944-8244
1944-8252
DOI:10.1021/acsami.9b19191