Nonparametric Accelerated Life Testing

Nonparametric Accelerated Life Testing

This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution...

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Veröffentlicht in:IEEE transactions on reliability 1982-01, Vol.R-31 (5), p.432-435
Hauptverfasser: Basu, A.P., Ebrahimi, Nader
Format: Artikel
Sprache:eng
Schlagworte:
Accelerated life tests
Acceleration
Censored data
Competing risks
computer applications
Costs
Life estimation
Life testing
Lifetime estimation
manufacturing
Neural networks
Nonparametric methods
quality control
reliability
Reliability theory
s-Consistent estimator
Series system
service life
Statistical analysis
Stress
System testing
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Beschreibung
Zusammenfassung:This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution at use-stress is given for both cases.
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.1982.5221417