Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV
In this work, the refractive index of beryllium in the photon energy range 20.4–250 eV was experimentally determined. The initial data include measurements of the transmittance of two free‐standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films...
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Veröffentlicht in: | Journal of synchrotron radiation 2020-01, Vol.27 (1), p.75-82 |
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Sprache: | eng |
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Zusammenfassung: | In this work, the refractive index of beryllium in the photon energy range 20.4–250 eV was experimentally determined. The initial data include measurements of the transmittance of two free‐standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers–Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology.
The complex refractive index of beryllium was experimentally determined in the spectral range 20.4–250 eV from transmission spectra of free‐standing thin films. A comparison of the optical constants of beryllium found in this way with those obtained earlier by another research group is performed. |
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ISSN: | 1600-5775 0909-0495 1600-5775 |
DOI: | 10.1107/S1600577519014188 |