Single crystals of chevrel-type compounds: Growth, stoichiometry and electrical resistivity
A series of rhombohedral Mo chalcogenides (Chevrel compounds) based on S or Se have been melted under argon pressures up to 100 atm. We have found that single crystals of an appreciable size (1 to 3 cm 3) can be grown by the Bridgman-Stockbarger technique. Density measurements on these crystals, tog...
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| Veröffentlicht in: | Materials research bulletin 1978-08, Vol.13 (8), p.743-750 |
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| creator | Flükiger, R. Baillif, R. Walker, E. |
| description | A series of rhombohedral Mo chalcogenides (Chevrel compounds) based on S or Se have been melted under argon pressures up to 100 atm. We have found that single crystals of an appreciable size (1 to 3 cm
3) can be grown by the Bridgman-Stockbarger technique. Density measurements on these crystals, together with x-ray and microscopic observations lead to the conclusion that the formula M
xMo
6X
8 describes correctly the great majority of these compounds. The sulfides with M = Pb, Sn as possible exceptions seem to be stabilized by a small excess of Mo relative to the stoichiometric ratio Mo:S=6:8. No evidence for the presence of S defects was found. The electrical resistivity of PbMo
6.2S
8 has been found to vary linearly as a function of temperature in the range T
c ≤ T ≤ 50 K, the lowest measured value at the normal state being
ϱ = 90 μΩ
cm
. |
| doi_str_mv | 10.1016/0025-5408(78)90035-1 |
| format | Article |
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3) can be grown by the Bridgman-Stockbarger technique. Density measurements on these crystals, together with x-ray and microscopic observations lead to the conclusion that the formula M
xMo
6X
8 describes correctly the great majority of these compounds. The sulfides with M = Pb, Sn as possible exceptions seem to be stabilized by a small excess of Mo relative to the stoichiometric ratio Mo:S=6:8. No evidence for the presence of S defects was found. The electrical resistivity of PbMo
6.2S
8 has been found to vary linearly as a function of temperature in the range T
c ≤ T ≤ 50 K, the lowest measured value at the normal state being
ϱ = 90 μΩ
cm
.</description><identifier>ISSN: 0025-5408</identifier><identifier>EISSN: 1873-4227</identifier><identifier>DOI: 10.1016/0025-5408(78)90035-1</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><ispartof>Materials research bulletin, 1978-08, Vol.13 (8), p.743-750</ispartof><rights>1978</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c401t-5a31ca0aef7b86a42910e4f5e101bc9078879bdf06dc397ee2a177bfebc1ef3e3</citedby><cites>FETCH-LOGICAL-c401t-5a31ca0aef7b86a42910e4f5e101bc9078879bdf06dc397ee2a177bfebc1ef3e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0025540878900351$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,65309</link.rule.ids></links><search><creatorcontrib>Flükiger, R.</creatorcontrib><creatorcontrib>Baillif, R.</creatorcontrib><creatorcontrib>Walker, E.</creatorcontrib><title>Single crystals of chevrel-type compounds: Growth, stoichiometry and electrical resistivity</title><title>Materials research bulletin</title><description>A series of rhombohedral Mo chalcogenides (Chevrel compounds) based on S or Se have been melted under argon pressures up to 100 atm. We have found that single crystals of an appreciable size (1 to 3 cm
3) can be grown by the Bridgman-Stockbarger technique. Density measurements on these crystals, together with x-ray and microscopic observations lead to the conclusion that the formula M
xMo
6X
8 describes correctly the great majority of these compounds. The sulfides with M = Pb, Sn as possible exceptions seem to be stabilized by a small excess of Mo relative to the stoichiometric ratio Mo:S=6:8. No evidence for the presence of S defects was found. The electrical resistivity of PbMo
6.2S
8 has been found to vary linearly as a function of temperature in the range T
c ≤ T ≤ 50 K, the lowest measured value at the normal state being
ϱ = 90 μΩ
cm
.</description><issn>0025-5408</issn><issn>1873-4227</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1978</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLxDAUhYMoOI7-AxdZiYLVm76SuhBk8AUDLtSVi5CmN06k09QkM9J_b8cRl67u4p5z4PsIOWZwwYCVlwBpkRQ5iFMuziqArEjYDpkwwbMkT1O-SyZ_kX1yEMIHAOSC8wl5e7bde4tU-yFE1QbqDNULXHtskzj048Mte7fqmnBF7737iotzGqKzemHdEqMfqOoaii3q6K1WLfUYbIh2beNwSPbMOIlHv3dKXu9uX2YPyfzp_nF2M090DiwmhcqYVqDQ8FqUKk8rBpibAke2WlfAheBV3RgoG51VHDFVjPPaYK0ZmgyzKTnZ7vbefa4wRLm0QWPbqg7dKsg0Y1WZVsUYzLdB7V0IHo3svV0qP0gGcmNSbjTJjSbJhfwxKdlYu97WcIRYW_QyaIudxsb6kVs2zv4_8A3gDXzg</recordid><startdate>19780801</startdate><enddate>19780801</enddate><creator>Flükiger, R.</creator><creator>Baillif, R.</creator><creator>Walker, E.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19780801</creationdate><title>Single crystals of chevrel-type compounds: Growth, stoichiometry and electrical resistivity</title><author>Flükiger, R. ; Baillif, R. ; Walker, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c401t-5a31ca0aef7b86a42910e4f5e101bc9078879bdf06dc397ee2a177bfebc1ef3e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1978</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Flükiger, R.</creatorcontrib><creatorcontrib>Baillif, R.</creatorcontrib><creatorcontrib>Walker, E.</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Materials research bulletin</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Flükiger, R.</au><au>Baillif, R.</au><au>Walker, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Single crystals of chevrel-type compounds: Growth, stoichiometry and electrical resistivity</atitle><jtitle>Materials research bulletin</jtitle><date>1978-08-01</date><risdate>1978</risdate><volume>13</volume><issue>8</issue><spage>743</spage><epage>750</epage><pages>743-750</pages><issn>0025-5408</issn><eissn>1873-4227</eissn><abstract>A series of rhombohedral Mo chalcogenides (Chevrel compounds) based on S or Se have been melted under argon pressures up to 100 atm. We have found that single crystals of an appreciable size (1 to 3 cm
3) can be grown by the Bridgman-Stockbarger technique. Density measurements on these crystals, together with x-ray and microscopic observations lead to the conclusion that the formula M
xMo
6X
8 describes correctly the great majority of these compounds. The sulfides with M = Pb, Sn as possible exceptions seem to be stabilized by a small excess of Mo relative to the stoichiometric ratio Mo:S=6:8. No evidence for the presence of S defects was found. The electrical resistivity of PbMo
6.2S
8 has been found to vary linearly as a function of temperature in the range T
c ≤ T ≤ 50 K, the lowest measured value at the normal state being
ϱ = 90 μΩ
cm
.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/0025-5408(78)90035-1</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
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| ispartof | Materials research bulletin, 1978-08, Vol.13 (8), p.743-750 |
| issn | 0025-5408 1873-4227 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_23196295 |
| source | Elsevier ScienceDirect Journals |
| title | Single crystals of chevrel-type compounds: Growth, stoichiometry and electrical resistivity |
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