Dielectric breakdown of polyacetylene

Cis-(CH) x , with lower electronic conductivity, has a higher breakdown strength than trans-(CH) x , with higher conductivity. However, the breakdown strengths of both (CH) x film isomers are much lower than those of other insulating polymers such as PE, PS, etc. The breakdown strength of (CH) x inc...

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Veröffentlicht in:Japanese Journal of Applied Physics 1983-11, Vol.22 (11), p.1734-1737
Hauptverfasser: YOSHINO, K, TERAUCHI, M, SAN HYON KIM, HAYASHI, S, INUISHI, Y
Format: Artikel
Sprache:eng
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Zusammenfassung:Cis-(CH) x , with lower electronic conductivity, has a higher breakdown strength than trans-(CH) x , with higher conductivity. However, the breakdown strengths of both (CH) x film isomers are much lower than those of other insulating polymers such as PE, PS, etc. The breakdown strength of (CH) x increases with increasing temperature from 77 K to around room temperature, and then above some critical temperature T c , it decreases rapidly. This behavior can be explained in terms of an electronic breakdown process at lower temperatures and by a thermal process at higher temperatures.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.22.1734