TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips
High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the...
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| Veröffentlicht in: | Analytical chemistry (Washington) 2019-12, Vol.91 (24), p.15355-15359 |
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| creator | Wang, Xiang Han, Lili Xin, Huolin Mirkin, Michael V |
| description | High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the progress in nano-SECM. Despite long-term efforts to improve previously developed procedures, the preparation and characterization of disk-type polished tips with the radius |
| doi_str_mv | 10.1021/acs.analchem.9b04316 |
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The ability to fabricate ultrasmall nanoelectrode tips is critical for the progress in nano-SECM. Despite long-term efforts to improve previously developed procedures, the preparation and characterization of disk-type polished tips with the radius <∼25 nm remains challenging and unpredictable. One of the problems is that the geometry of such tips is hard to characterize by either SEM or atomic force microscopy (AFM) that has been employed for examination of somewhat larger nanoelectrodes. Herein, we report a new approach to more predictable and reproducible two-step fabrication of ultrasmall (≤10 nm radius) polished Pt electrodes assisted by transmission electron microscopy (TEM) imaging. Both voltammetric and SECM responses of the prepared nanoelectrodes are consistent with the size and geometry extracted from TEM images. These tips can be used to attain sub-10 nm spatial resolution of SECM imaging and kinetic studies.</description><identifier>ISSN: 0003-2700</identifier><identifier>EISSN: 1520-6882</identifier><identifier>DOI: 10.1021/acs.analchem.9b04316</identifier><identifier>PMID: 31741378</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><subject>Atomic force microscopy ; Chemistry ; Electrochemistry ; Fabrication ; Mapping ; Microscopes ; Microscopy ; Nanoparticles ; Scanning ; Spatial discrimination ; Spatial resolution ; Tips ; Transmission electron microscopy</subject><ispartof>Analytical chemistry (Washington), 2019-12, Vol.91 (24), p.15355-15359</ispartof><rights>Copyright American Chemical Society Dec 17, 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a488t-f77f6ec1bc94cf64041038ca507974e8da61c6540e803a73c2261592888cf6d83</citedby><cites>FETCH-LOGICAL-a488t-f77f6ec1bc94cf64041038ca507974e8da61c6540e803a73c2261592888cf6d83</cites><orcidid>0000-0002-3424-5810</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acs.analchem.9b04316$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acs.analchem.9b04316$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/31741378$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Xiang</creatorcontrib><creatorcontrib>Han, Lili</creatorcontrib><creatorcontrib>Xin, Huolin</creatorcontrib><creatorcontrib>Mirkin, Michael V</creatorcontrib><title>TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips</title><title>Analytical chemistry (Washington)</title><addtitle>Anal. Chem</addtitle><description>High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the progress in nano-SECM. Despite long-term efforts to improve previously developed procedures, the preparation and characterization of disk-type polished tips with the radius <∼25 nm remains challenging and unpredictable. One of the problems is that the geometry of such tips is hard to characterize by either SEM or atomic force microscopy (AFM) that has been employed for examination of somewhat larger nanoelectrodes. Herein, we report a new approach to more predictable and reproducible two-step fabrication of ultrasmall (≤10 nm radius) polished Pt electrodes assisted by transmission electron microscopy (TEM) imaging. Both voltammetric and SECM responses of the prepared nanoelectrodes are consistent with the size and geometry extracted from TEM images. These tips can be used to attain sub-10 nm spatial resolution of SECM imaging and kinetic studies.</description><subject>Atomic force microscopy</subject><subject>Chemistry</subject><subject>Electrochemistry</subject><subject>Fabrication</subject><subject>Mapping</subject><subject>Microscopes</subject><subject>Microscopy</subject><subject>Nanoparticles</subject><subject>Scanning</subject><subject>Spatial discrimination</subject><subject>Spatial resolution</subject><subject>Tips</subject><subject>Transmission electron microscopy</subject><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kDtPwzAUhS0EoqXwDxCKxMKScq_t2s5YVS0gtTC0zJHjOJAqjxInQ_89jvoYGJju8p1zdD9C7hHGCBSftXFjXenCfNtyHCXAGYoLMsQJhVAoRS_JEABYSCXAgNw4twVABBTXZMBQcmRSDcn7Zr4Kp87lrrVpsNBJkxvd5nUV1Fmw7pIQIajKYG10VeXVVzAvrGmbuh_1YBGsctPUztS7fbDJd-6WXGW6cPbueEfkczHfzF7D5cfL22y6DDVXqg0zKTNhDSYm4iYTHDgCU0ZPQEaSW5VqgUZMOFgFTEtmKBU4iahSyuOpYiPydOjdNfVPZ10bl7kztih0ZevOxZR5XEQKmUcf_6Dbumu8uJ5i3kkUUekpfqD6d1xjs3jX5KVu9jFC3PuOve_45Ds--vaxh2N5l5Q2PYdOgj0AB6CPn4f_7fwFKMCMtw</recordid><startdate>20191217</startdate><enddate>20191217</enddate><creator>Wang, Xiang</creator><creator>Han, Lili</creator><creator>Xin, Huolin</creator><creator>Mirkin, Michael V</creator><general>American Chemical Society</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7TM</scope><scope>7U5</scope><scope>7U7</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-3424-5810</orcidid></search><sort><creationdate>20191217</creationdate><title>TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips</title><author>Wang, Xiang ; Han, Lili ; Xin, Huolin ; Mirkin, Michael V</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a488t-f77f6ec1bc94cf64041038ca507974e8da61c6540e803a73c2261592888cf6d83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Atomic force microscopy</topic><topic>Chemistry</topic><topic>Electrochemistry</topic><topic>Fabrication</topic><topic>Mapping</topic><topic>Microscopes</topic><topic>Microscopy</topic><topic>Nanoparticles</topic><topic>Scanning</topic><topic>Spatial discrimination</topic><topic>Spatial resolution</topic><topic>Tips</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Xiang</creatorcontrib><creatorcontrib>Han, Lili</creatorcontrib><creatorcontrib>Xin, Huolin</creatorcontrib><creatorcontrib>Mirkin, Michael V</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Nucleic Acids Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Toxicology Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>MEDLINE - Academic</collection><jtitle>Analytical chemistry (Washington)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Xiang</au><au>Han, Lili</au><au>Xin, Huolin</au><au>Mirkin, Michael V</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips</atitle><jtitle>Analytical chemistry (Washington)</jtitle><addtitle>Anal. 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Herein, we report a new approach to more predictable and reproducible two-step fabrication of ultrasmall (≤10 nm radius) polished Pt electrodes assisted by transmission electron microscopy (TEM) imaging. Both voltammetric and SECM responses of the prepared nanoelectrodes are consistent with the size and geometry extracted from TEM images. These tips can be used to attain sub-10 nm spatial resolution of SECM imaging and kinetic studies.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>31741378</pmid><doi>10.1021/acs.analchem.9b04316</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-3424-5810</orcidid><oa>free_for_read</oa></addata></record> |
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| source | ACS Publications |
| subjects | Atomic force microscopy Chemistry Electrochemistry Fabrication Mapping Microscopes Microscopy Nanoparticles Scanning Spatial discrimination Spatial resolution Tips Transmission electron microscopy |
| title | TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips |
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