TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips

TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips

High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the...

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Veröffentlicht in:Analytical chemistry (Washington) 2019-12, Vol.91 (24), p.15355-15359
Hauptverfasser: Wang, Xiang, Han, Lili, Xin, Huolin, Mirkin, Michael V
Format: Artikel
Sprache:eng
Schlagworte:
Atomic force microscopy
Chemistry
Electrochemistry
Fabrication
Mapping
Microscopes
Microscopy
Nanoparticles
Scanning
Spatial discrimination
Spatial resolution
Tips
Transmission electron microscopy
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Zusammenfassung:High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the progress in nano-SECM. Despite long-term efforts to improve previously developed procedures, the preparation and characterization of disk-type polished tips with the radius
ISSN:0003-2700
1520-6882
DOI:10.1021/acs.analchem.9b04316