Conduction mechanism and 1/ f noise in ZnO varistors

The conduction mechanism in ZnO varistors has been studied assuming thermionic emission as the only way of charge transport. A model elaborated on that basis has been satisfactorily applied to the approximation of the I–U and C–U characteristics and has made it possible to determine the barrier heig...

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Veröffentlicht in:Journal of applied physics 1983-01, Vol.54 (6), p.2900-2906
Hauptverfasser: Kusy, A., Kleinpenning, T. G. M.
Format: Artikel
Sprache:eng
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Zusammenfassung:The conduction mechanism in ZnO varistors has been studied assuming thermionic emission as the only way of charge transport. A model elaborated on that basis has been satisfactorily applied to the approximation of the I–U and C–U characteristics and has made it possible to determine the barrier height Φb(300 K)=0.86 V, the donor concentration ND≂1019 cm−3, the effective number of grains between the electrodes g≂20, the position of the Fermi level EC−EF≂0.07 eV, and the donor level EC−ED≂0.20 eV. The relative power spectral density of 1/f current fluctuations SI/I2 in the varistors in the ohmic region has been calculated, starting from the mobility fluctuation approach of the 1/f noise. The calculated linear relationship between SI/I2 and the varistor resistance in the ohmic region has been confirmed by the experimental results. The calculated 1/f noise density is in agreement with the observed density.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.332491