Analyses of sputtered films of Nb3Ge

The analyses of Nb-Ge films prepared by sputtering with a modified rf arrangement are reported. The results indicate the importance of thermalization of sputtered particles for the formation of the high-transition-temperature compound Nb3Ge.

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Veröffentlicht in:Applied physics letters 1977-05, Vol.30 (10), p.543-545
Hauptverfasser: Wu, C. T., Kammerdiner, Lee, Luo, H. L.
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container_issue 10
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container_title Applied physics letters
container_volume 30
creator Wu, C. T.
Kammerdiner, Lee
Luo, H. L.
description The analyses of Nb-Ge films prepared by sputtering with a modified rf arrangement are reported. The results indicate the importance of thermalization of sputtered particles for the formation of the high-transition-temperature compound Nb3Ge.
doi_str_mv 10.1063/1.89228
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_22866898</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>22866898</sourcerecordid><originalsourceid>FETCH-LOGICAL-c256t-a94e901f4a7ca4ca1d6165af8f12493327f37811ce300e70e7b40ee83825a5a03</originalsourceid><addsrcrecordid>eNotUE1Lw0AUXETBWMW_kIPoKXXfvuzXsRRbhaIXPS_b7VuIJE3dTQ7998ZWGBhmGAZmGLsHPgeu8BnmxgphLlgBXOsKAcwlKzjnWCkr4Zrd5Pw9SSkQC_aw2Pv2mCmXfSzzYRwGSrQrY9N2J-t9i2u6ZVfRt5nu_nnGvlYvn8vXavOxflsuNlUQUg2VtzVZDrH2Ovg6eNgpUNJHE0HUFlHoiNoABELOSU_Y1pzIoBHSS89xxh7PvYfU_4yUB9c1OVDb-j31Y3bTLKWMNVPw6RwMqc85UXSH1HQ-HR1w9_eCA3d6AX8BtS9L9g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>22866898</pqid></control><display><type>article</type><title>Analyses of sputtered films of Nb3Ge</title><source>AIP Digital Archive</source><creator>Wu, C. T. ; Kammerdiner, Lee ; Luo, H. L.</creator><creatorcontrib>Wu, C. T. ; Kammerdiner, Lee ; Luo, H. L.</creatorcontrib><description>The analyses of Nb-Ge films prepared by sputtering with a modified rf arrangement are reported. The results indicate the importance of thermalization of sputtered particles for the formation of the high-transition-temperature compound Nb3Ge.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.89228</identifier><language>eng</language><ispartof>Applied physics letters, 1977-05, Vol.30 (10), p.543-545</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c256t-a94e901f4a7ca4ca1d6165af8f12493327f37811ce300e70e7b40ee83825a5a03</citedby><cites>FETCH-LOGICAL-c256t-a94e901f4a7ca4ca1d6165af8f12493327f37811ce300e70e7b40ee83825a5a03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Wu, C. T.</creatorcontrib><creatorcontrib>Kammerdiner, Lee</creatorcontrib><creatorcontrib>Luo, H. L.</creatorcontrib><title>Analyses of sputtered films of Nb3Ge</title><title>Applied physics letters</title><description>The analyses of Nb-Ge films prepared by sputtering with a modified rf arrangement are reported. The results indicate the importance of thermalization of sputtered particles for the formation of the high-transition-temperature compound Nb3Ge.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNotUE1Lw0AUXETBWMW_kIPoKXXfvuzXsRRbhaIXPS_b7VuIJE3dTQ7998ZWGBhmGAZmGLsHPgeu8BnmxgphLlgBXOsKAcwlKzjnWCkr4Zrd5Pw9SSkQC_aw2Pv2mCmXfSzzYRwGSrQrY9N2J-t9i2u6ZVfRt5nu_nnGvlYvn8vXavOxflsuNlUQUg2VtzVZDrH2Ovg6eNgpUNJHE0HUFlHoiNoABELOSU_Y1pzIoBHSS89xxh7PvYfU_4yUB9c1OVDb-j31Y3bTLKWMNVPw6RwMqc85UXSH1HQ-HR1w9_eCA3d6AX8BtS9L9g</recordid><startdate>19770515</startdate><enddate>19770515</enddate><creator>Wu, C. T.</creator><creator>Kammerdiner, Lee</creator><creator>Luo, H. L.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19770515</creationdate><title>Analyses of sputtered films of Nb3Ge</title><author>Wu, C. T. ; Kammerdiner, Lee ; Luo, H. L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c256t-a94e901f4a7ca4ca1d6165af8f12493327f37811ce300e70e7b40ee83825a5a03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, C. T.</creatorcontrib><creatorcontrib>Kammerdiner, Lee</creatorcontrib><creatorcontrib>Luo, H. L.</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wu, C. T.</au><au>Kammerdiner, Lee</au><au>Luo, H. L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analyses of sputtered films of Nb3Ge</atitle><jtitle>Applied physics letters</jtitle><date>1977-05-15</date><risdate>1977</risdate><volume>30</volume><issue>10</issue><spage>543</spage><epage>545</epage><pages>543-545</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The analyses of Nb-Ge films prepared by sputtering with a modified rf arrangement are reported. The results indicate the importance of thermalization of sputtered particles for the formation of the high-transition-temperature compound Nb3Ge.</abstract><doi>10.1063/1.89228</doi><tpages>3</tpages></addata></record>
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title Analyses of sputtered films of Nb3Ge
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T08%3A04%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analyses%20of%20sputtered%20films%20of%20Nb3Ge&rft.jtitle=Applied%20physics%20letters&rft.au=Wu,%20C.%20T.&rft.date=1977-05-15&rft.volume=30&rft.issue=10&rft.spage=543&rft.epage=545&rft.pages=543-545&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.89228&rft_dat=%3Cproquest_cross%3E22866898%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=22866898&rft_id=info:pmid/&rfr_iscdi=true