Comparative LEED and RHEED examination of stepped surfaces; Application to Cu(111) and GaAs(100) vicinal surfaces

Comparative LEED and RHEED examination of stepped surfaces; Application to Cu(111) and GaAs(100) vicinal surfaces

Vicinal surfaces of copper and gallium arsenide samples are examined with LEED and RHEED techniques. The assessments obtained by the two techniques are compared and a significant advantage of RHEED is demonstrated.

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Veröffentlicht in:Surface science 1977-01, Vol.65 (2), p.563-577
Hauptverfasser: Hottier, F., Theeten, J.B., Masson, A., Domange, J.L.
Format: Artikel
Sprache:eng
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Zusammenfassung:Vicinal surfaces of copper and gallium arsenide samples are examined with LEED and RHEED techniques. The assessments obtained by the two techniques are compared and a significant advantage of RHEED is demonstrated.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(77)90466-6