Electrical effects of SiC inclusions in EFG silicon ribbon solar cells
The electrical effects of included silicon carbide (SiC) particles in edge-defined film-fed grown silicon ribbons have been examined. By employing a scanning electron microscope operated in the electron-beam-induced current mode, as well as observing the effects of SiC particles on solar-cell charac...
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Veröffentlicht in: | J. Appl. Phys.; (United States) 1976-06, Vol.47 (6), p.2614-2619 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The electrical effects of included silicon carbide (SiC) particles in edge-defined film-fed grown silicon ribbons have been examined. By employing a scanning electron microscope operated in the electron-beam-induced current mode, as well as observing the effects of SiC particles on solar-cell characteristics, the electrical activity of particles and particle-generated defects were studied. The influence of SiC particles largely appears to be a result of impurity accumulation around them rather than a direct effect of the inclusions. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.322980 |