Electrical effects of SiC inclusions in EFG silicon ribbon solar cells

The electrical effects of included silicon carbide (SiC) particles in edge-defined film-fed grown silicon ribbons have been examined. By employing a scanning electron microscope operated in the electron-beam-induced current mode, as well as observing the effects of SiC particles on solar-cell charac...

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Veröffentlicht in:J. Appl. Phys.; (United States) 1976-06, Vol.47 (6), p.2614-2619
Hauptverfasser: Hari Rao, C. V., Bates, H. E., Ravi, K. V.
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Sprache:eng
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Zusammenfassung:The electrical effects of included silicon carbide (SiC) particles in edge-defined film-fed grown silicon ribbons have been examined. By employing a scanning electron microscope operated in the electron-beam-induced current mode, as well as observing the effects of SiC particles on solar-cell characteristics, the electrical activity of particles and particle-generated defects were studied. The influence of SiC particles largely appears to be a result of impurity accumulation around them rather than a direct effect of the inclusions.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.322980