Magnetization and magnetoresistance in Fe-ion-implanted Cu and Ag thin films
Diluted granular films of Cu-Fe and Ag-Fe (iron content less than or equal to 2%) were produced using super(57)Fe ion implantation on Cu(Ag) films previously grown by laser ablation. Conversion electron Mossbauer spectroscopy shows that the implanted Fe forms either very small clusters (up to a few...
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Veröffentlicht in: | Journal of magnetism and magnetic materials 1997-09, Vol.173 (3), p.230-240 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Diluted granular films of Cu-Fe and Ag-Fe (iron content less than or equal to 2%) were produced using super(57)Fe ion implantation on Cu(Ag) films previously grown by laser ablation. Conversion electron Mossbauer spectroscopy shows that the implanted Fe forms either very small clusters (up to a few atoms) or large iron alpha -phase particles. These structural characteristics directly reflect on the magnetization, which exhibits ferromagnetic-like behaviour at room temperature (due to large clusters) superimposed by a significant paramagnetic contribution at low temperatures due to the small clusters. We observe deviations from strict superparamagnetic behaviour due to non-negligible local anisotropy effects at low temperatures and low fields. The Kondo effect is particularly enhanced in the Cu-Fe films which have higher concentration of isolated Fe atoms and small sizes clusters. The magnetoresistivity Delta rho / rho of our films is dominated (for 0 less than or equal to mu sub(0)H less than or equal to 15 T) by a linear term in H, attributed to GMR-like effect from spin-dependent scattering when an electron passes between adjacent large and small clusters. At low fields we observe instead Delta rho / rho proportional to H super(2), due to the usual GMR effect between large clusters, during the alignment of their easy axes. The relevant physical differences (structural, magnetic and magnetoresistive) observed in our ion-implanted diluted Fe films, with respect to the concentrated granular films, are critically analysed. |
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ISSN: | 0304-8853 |
DOI: | 10.1016/S0304-8853(97)00207-2 |