Direct Radiation Detection by a Semiconductive Metal–Organic Framework
Semiconductive metal–organic frameworks (MOFs) have attracted extraordinary research interest in recent years; however, electronic applications based on these emerging materials are still in their infancy. Herein, we show that a lanthanide-based semiconductive MOF (SCU-12) can effectively convert X-...
Gespeichert in:
Veröffentlicht in: | Journal of the American Chemical Society 2019-05, Vol.141 (20), p.8030-8034 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Semiconductive metal–organic frameworks (MOFs) have attracted extraordinary research interest in recent years; however, electronic applications based on these emerging materials are still in their infancy. Herein, we show that a lanthanide-based semiconductive MOF (SCU-12) can effectively convert X-ray photons to electrical current signals under continuous hard X-ray radiation. The semiconductive MOF-based polycrystalline detection device presents a promising X-ray sensitivity with the value of 23.8 μC Gyair –1 cm–2 under 80 kVp X-ray exposure, competitive with the commercially available amorphous selenium (α-Se) detector. The lowest detectable X-ray dose rate is 0.705 μGy s–1, representing the record value among all X-ray detectors fabricated by polycrystalline materials. This work discloses the first demonstration of hard radiation detection by semiconductive MOFs, providing a horizon that can guide the synthesis of a new generation of radiation detection materials by taking the advantages of structural designability and property tunability in the MOF system. |
---|---|
ISSN: | 0002-7863 1520-5126 |
DOI: | 10.1021/jacs.9b01270 |