High resolution hologram interferometry by electronic phase measurement
The described dual frequency method interpolates the fringe pattern of any kind of hologram interfermetry down to better than 1 100 of a fringe, independent of intensity variations. Experiments with double-exposure holography demonstrate a resolution of 6 × 10 −4 fringes at any point of the object....
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| Veröffentlicht in: | Optics communications 1973-12, Vol.9 (4), p.412-416 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The described dual frequency method interpolates the fringe pattern of any kind of hologram interfermetry down to better than
1
100
of a fringe, independent of intensity variations. Experiments with double-exposure holography demonstrate a resolution of 6 × 10
−4 fringes at any point of the object. Spatial derivatives of deformations can be measured accurately for mechanical strain analysis. |
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| ISSN: | 0030-4018 1873-0310 |
| DOI: | 10.1016/0030-4018(73)90284-8 |