Gate-based single-shot readout of spins in silicon

Electron spins in silicon quantum dots provide a promising route towards realizing the large number of coupled qubits required for a useful quantum processor 1 – 7 . For the implementation of quantum algorithms and error detection 8 – 10 , qubit measurements are ideally performed in a single shot, which is presently achieved using on-chip charge sensors, capacitively coupled to the quantum dots 11 . However, as the number of qubits is increased, this approach becomes impractical due to the footprint and complexity of the charge sensors, combined with the required proximity to the quantum dots 12 . Alternatively, the spin state can be measured directly by detecting the complex impedance of spin-dependent electron tunnelling between quantum dots 13 – 15 . This can be achieved using radiofrequency reflectometry on a single gate electrode defining the quantum dot itself 15 – 19 , significantly reducing the gate count and architectural complexity, but thus far it has not been possible to achieve single-shot spin readout using this technique. Here, we detect single electron tunnelling in a double quantum dot and demonstrate that gate-based sensing can be used to read out the electron spin state in a single shot, with an average readout fidelity of 73%. The result demonstrates a key step towards the readout of many spin qubits in parallel, using a compact gate design that will be needed for a large-scale semiconductor quantum processor. Instead of using capacitively coupled charge sensors, which imply additional complexity in the device architecture, radiofrequency reflectometry on the gate defining the quantum dot can read out the spin state of a double quantum dot in a single shot.