Van der Waals Broken-Gap p–n Heterojunction Tunnel Diode Based on Black Phosphorus and Rhenium Disulfide
The broken-gap (type III) van der Waals heterojunction is of particular interest, as there is no overlap between energy bands of its two stacked materials. Despite several studies on straddling-gap (type I) and staggered-gap (type II) vdW heterojunctions, comprehensive understanding of current trans...
Gespeichert in:
Veröffentlicht in: | ACS applied materials & interfaces 2019-02, Vol.11 (8), p.8266-8275 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The broken-gap (type III) van der Waals heterojunction is of particular interest, as there is no overlap between energy bands of its two stacked materials. Despite several studies on straddling-gap (type I) and staggered-gap (type II) vdW heterojunctions, comprehensive understanding of current transport and optoelectronic effects in a type-III heterojunction remains elusive. Here, we report gate-tunable current rectifying characteristics in a black phosphorus (BP)/rhenium disulfide (ReS2) type-III p–n heterojunction diode. Current transport in this heterojunction was modeled using the Simmons approximation through direct tunneling and Fowler–Nordheim tunneling in lower- and higher-bias regimes, respectively. We showed that a p–n diode based on a type-III heterojunction is mainly governed by tunneling-mediated transport, but that transport in a type-I p–n heterojunction is dominated by majority carrier diffusion in the higher-bias regime. Upon illumination with a 532 nm wavelength laser, the BP/ReS2 type-III p–n heterojunction showed a photo responsivity of 8 mA/W at a laser power as high as 100 μW and photovoltaic energy conversion with an external peak quantum efficiency of 0.3%. Finally, we demonstrated a binary inverter consisting of BP p-channel and ReS2 n-channel thin film transistors for logic applications. |
---|---|
ISSN: | 1944-8244 1944-8252 |
DOI: | 10.1021/acsami.8b22103 |