Fourier Analysis of X-Ray Patterns of Vitreous SiO sub 2 and B sub 2 O sub 3

The X-ray scattering curves for vitreous SiO sub 2 and B sub 2 O sub 3 are obtained in a vacuum camera, using monochromatic Mo and Cu radiation. A Fourier analysis of the scattering curve gives directly a curve representing the distribution of neighboring atoms about any one atom. For SiO sub 2 , the distribution curve establishes definitely the tetrahedral Si--O network. The distribution curve for B sub 2 O sub 3 indicates a triangular coordination, each B surrounded by three oxygens, and each O shared between two borons. The interatomic distances which are found are in good agreement with the values found in crystalline silicates and borates. The importance of the new Fourier method of analysis of glass diffraction patterns is emphasized by the fact that the distribution curves which are obtained are unique, no assumptions as to structure being involved.