Electrochemical impacts complement light scattering techniques for in situ nanoparticle sizing

Electrochemical impacts complement light scattering techniques for in situ nanoparticle sizing

We show that the electrochemical particle-impact technique (or 'nano-impacts') complements light scattering techniques for sizing both mono- and poly-disperse nanoparticles. It is found that established techniques - Dynamic Light Scattering (DLS) and Nanoparticle Tracking Analysis (NTA) -...

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Veröffentlicht in:Nanoscale 2019-01, Vol.11 (4), p.1720-1727
Hauptverfasser: Xie, Ruochen, Batchelor-McAuley, Christopher, Young, Neil P, Compton, Richard G
Format: Artikel
Sprache:eng
Schlagworte:
Atomic properties
Nanoparticles
Photon correlation spectroscopy
Polydispersity
Scattering
Sizing
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Zusammenfassung:We show that the electrochemical particle-impact technique (or 'nano-impacts') complements light scattering techniques for sizing both mono- and poly-disperse nanoparticles. It is found that established techniques - Dynamic Light Scattering (DLS) and Nanoparticle Tracking Analysis (NTA) - can accurately measure the diameters of '30 nm' silver particles assuming spherical shapes, but are unable to accurately size a smaller '20 nm' sample. In contrast, nano-impacts have a high accuracy (
ISSN:2040-3364
2040-3372
DOI:10.1039/c8nr09172b