Diagnostic spectra for XPS analysis of CuOSH compounds

An X-ray photoelectron spectroscopy analysis of certain standard materials from the system CuOSH was carried out. This system is important in the study of corrosion products formed on copper in aqueous or atmospheric sulfur-bearing environments. The materials studied included Cu, Cu 2O, CuO, Cu(OH) 2, Cu 2S, CuS and CuSO 4. Spectral features such as lineshape, peak energy and peak intensity for Cu2p, Cu( L 3 M 4,5 M 4,5) Auger, O1s and S2p bands were examined. Relative atomic sensitivity factors for the ligands with respect to copper were determined. A chemical state plot and a diagnostic decision tree were prepared from the data.