Effect of Sodium Hypochlorite and EDTA on Surface Roughness of HyFlex CM and HyFlex EDM Files

The aim of the present study was to compare the effect of exposure to sodium hypochlorite (NaOCl) and ethylenediaminetetraacetic acid (EDTA) on the surface topography and roughness of HyFlex controlled memory (CM) and HyFlex electrical discharge machining (EDM) using atomic force microscopy (AFM). T...

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Veröffentlicht in:	Microscopy research and technique 2018-12, Vol.81 (12), p.1406-1411
Hauptverfasser:	Uslu, Gülşah, Özyürek, Taha, Yılmaz, Koray
Format:	Artikel
Sprache:	eng
Schlagworte:	Acetic acid Atomic force microscopy Data processing Deformation Edetic acid Electric discharge machining ethylenediaminetetraacetic acid Ethylenediaminetetraacetic acids Exposure HyFlex CM HyFlex EDM Intermetallic compounds Microscopy Nickel titanides Porosity Sodium Sodium hypochlorite sodium hypohlorite Sterilization Submerging Surface roughness Topography Variance analysis
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Beschreibung
Zusammenfassung:	The aim of the present study was to compare the effect of exposure to sodium hypochlorite (NaOCl) and ethylenediaminetetraacetic acid (EDTA) on the surface topography and roughness of HyFlex controlled memory (CM) and HyFlex electrical discharge machining (EDM) using atomic force microscopy (AFM). Twenty HyFlex EDM (25/.08) and 20 HyFlex CM (25/.06) files were divided into five groups (n = 4). One group served as a negative control group. The files in the other groups were exposed to 5.25% NaOCl and 17% EDTA solutions at 37°C for 5 and 10 min, respectively, and examined using AFM after each exposure. The data were analyzed using one‐way ANOVA test. The lowest values were observed in the control group of HyFlex EDM files (p
ISSN:	1059-910X 1097-0029
DOI:	10.1002/jemt.23098