Superior techniques for eliminating ring artifacts in X-ray micro-tomography

Synchrotron-based X-ray micro-tomography systems often suffer severe ring artifacts in reconstructed images. In sinograms the artifacts appear as straight lines or stripe artifacts. These artifacts are caused by the irregular response of a detecting system giving rise to a variety of observed types...

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Veröffentlicht in:Optics express 2018-10, Vol.26 (22), p.28396-28412
Hauptverfasser: Vo, Nghia T, Atwood, Robert C, Drakopoulos, Michael
Format: Artikel
Sprache:eng
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Zusammenfassung:Synchrotron-based X-ray micro-tomography systems often suffer severe ring artifacts in reconstructed images. In sinograms the artifacts appear as straight lines or stripe artifacts. These artifacts are caused by the irregular response of a detecting system giving rise to a variety of observed types of stripes: full stripes, partial stripes, fluctuating stripes, and unresponsive stripes. The use of pre-processing techniques such as distortion correction or phase retrieval blurs and enlarges these stripes. It is impossible for a single approach to remove all types of stripe artifacts. Here, we propose three techniques for tackling all of them. The proposed techniques are easy to implement; do not generate extra stripe artifacts and void-center artifacts; and give superior quality on challenging data sets and in comparison with other techniques. Implementations in Python and a challenging data set are available for download.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.26.028396