Dielectric Properties of Conductively Loaded Polyimides in the Far Infrared

The dielectric properties of selected conductively-loaded polyimide samples are characterized in the microwave through far-infrared wavebands. These materials, belonging to the Vespel family, are more readily formed by direct machining than their ceramic-loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600 cm(exp −1) (0.03–18 THz) were performed and used in parametrization of the media’s dielectric function at frequencies below ≈3 THz.