Fabrication of microfluidic cavities using Si-to-glass anodic bonding
We demonstrate the fabrication of ∼1.08 μm deep microfluidic cavities with characteristic size as large as 7 mm × 11 mm or 11 mm diameter, using a silicon-glass anodic bonding technique that does not require posts to act as separators to define cavity height. Since the phase diagram of 3He is signif...
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Veröffentlicht in: | Review of scientific instruments 2018-07, Vol.89 (7), p.073902-073902 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We demonstrate the fabrication of ∼1.08 μm deep
microfluidic cavities with characteristic size as large as 7 mm × 11 mm or 11 mm diameter,
using a silicon-glass anodic bonding technique that does not require posts to act as
separators to define cavity height. Since the phase diagram of 3He is
significantly altered under confinement, posts might act as pinning centers for phase
boundaries. The previous generation of cavities relied on full wafer-bonding which is more
prone to failure and requires dicing post-bonding, whereas these cavities are made by
bonding a pre-cut piece of Hoya SD-2 glass to a patterned piece of silicon in which the
cavity is defined by etching. Anodic bonding was carried out at 425 °C with 200 V, and we
observe that pressurizing the cavity to failure (>30 bars pressure) results in glass
breaking, rather than the glass-silicon bond separation. In this article, we discuss the
detailed fabrication of the cavity, its edges, and details of the junction between the
coin silver fill line and the silicon base of the cavity that enables a low
internal-friction joint. This feature is important for mass coupling torsional oscillator
experimental assays of the superfluid inertial contribution where a high quality factor
(Q) improves frequency resolution. The surface preparation
that yields well-characterized smooth surfaces to eliminate pinning sites, the use of
transparent glass as a cover permitting optical access, low temperature capability, and
attachment of pressure-capable ports for fluid access may be features that are important
in other applications. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.5031837 |