Measuring the Vibrational Density of States of Nanocrystal-Based Thin Films with Inelastic X‑ray Scattering

Knowledge of the vibrational structure of a semiconductor is essential for explaining its optical and electronic properties and enabling optimized materials selection for optoelectronic devices. However, measurement of the vibrational density of states of nanomaterials is challenging. Here, using th...

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Veröffentlicht in:	The journal of physical chemistry letters 2018-04, Vol.9 (7), p.1561-1567
Hauptverfasser:	Yazdani, Nuri, Nguyen-Thanh, Tra, Yarema, Maksym, Lin, Weyde M M, Gao, Ramon, Yarema, Olesya, Bosak, Alexey, Wood, Vanessa
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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