Limits in measurements of contact lens surface profile using atomic force microscopy

[Display omitted] •The surface profiles of seven models of contact lenses were measured.•Statistical roughness parameters are calculated, including standard deviation.•Results obtained by a silicon tip and a tip covered with alkylsilane are compared.•Reliability and limits of presented measurements...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Colloids and surfaces, B, Biointerfaces B, Biointerfaces, 2018-05, Vol.165, p.229-234
Hauptverfasser:	Brygoła, Rafał, Sęk, Sławomir, Sokołowski, Maciej, Kowalczyk-Hernández, Marek, Pniewski, Jacek
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy Contact lenses Roughness Topography
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!