Limits in measurements of contact lens surface profile using atomic force microscopy

[Display omitted] •The surface profiles of seven models of contact lenses were measured.•Statistical roughness parameters are calculated, including standard deviation.•Results obtained by a silicon tip and a tip covered with alkylsilane are compared.•Reliability and limits of presented measurements are discussed. In the paper the results of AFM surface profile measurements of seven new long-wear contact lenses (CL) available in Poland are presented. Calculated statistical roughness parameters are shown, namely standard deviation (RMS), mean roughness, maximum difference between peak and valley, skewness, and kurtosis. It is demonstrated that CLs manufactured using recent methods, such as two-stage polimerisation or extending silicon chains exhibit small RMS, less than 10 nm, in comparison with older generation CLs which maintains RMS on the level of tens of nanometers. Then, a comparison of results obtained using a typical silicon tip and a silicon tip covered with alkylsilane is also demonstrated. As a result, roughness parameters, such as RMS, are higher for the case of alkylsilane-coated tip than for a typical silicon tip, 8.39 ± 0.16 nm vs. 6.22 ± 0.9 nm, which leads to the conclusion that the proper choice of the tip material significantly influences the outcome of the experiment. Finally, the reliability and limits of such measurements are discussed.