Steep-slope hysteresis-free negative capacitance MoS2 transistors
The so-called Boltzmann tyranny defines the fundamental thermionic limit of the subthreshold slope of a metal–oxide–semiconductor field-effect transistor (MOSFET) at 60 mV dec −1 at room temperature and therefore precludes lowering of the supply voltage and overall power consumption 1 , 2 . Adding a...
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Veröffentlicht in: | Nature nanotechnology 2018, Vol.13 (1), p.24-28 |
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Hauptverfasser: | , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The so-called Boltzmann tyranny defines the fundamental thermionic limit of the subthreshold slope of a metal–oxide–semiconductor field-effect transistor (MOSFET) at 60 mV dec
−1
at room temperature and therefore precludes lowering of the supply voltage and overall power consumption
1
,
2
. Adding a ferroelectric negative capacitor to the gate stack of a MOSFET may offer a promising solution to bypassing this fundamental barrier
3
. Meanwhile, two-dimensional semiconductors such as atomically thin transition-metal dichalcogenides, due to their low dielectric constant and ease of integration into a junctionless transistor topology, offer enhanced electrostatic control of the channel
4
–
12
. Here, we combine these two advantages and demonstrate a molybdenum disulfide (MoS
2
) two-dimensional steep-slope transistor with a ferroelectric hafnium zirconium oxide layer in the gate dielectric stack. This device exhibits excellent performance in both on and off states, with a maximum drain current of 510 μA μm
−1
and a sub-thermionic subthreshold slope, and is essentially hysteresis-free. Negative differential resistance was observed at room temperature in the MoS
2
negative-capacitance FETs as the result of negative capacitance due to the negative drain-induced barrier lowering. A high on-current-induced self-heating effect was also observed and studied.
A field-effect MoS2 transistor with a negative capacitor in its gate shows stable, hysteresis-free performance characterized by a sub-thermionic sub-threshold slope. |
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ISSN: | 1748-3387 1748-3395 |
DOI: | 10.1038/s41565-017-0010-1 |