Exploring the detection limits of infrared near-field microscopy regarding small buried structures and pushing them by exploiting superlens-related effects

We present a study on subsurface imaging with an infrared scattering-type scanning near-field optical microscope (s-SNOM). The depth-limitation for the visibility of gold nanoparticles with a diameter of 50 nm under Si N is determined to about 50 nm. We first investigate spot size and signal strengt...

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Veröffentlicht in:Optics express 2016-03, Vol.24 (5), p.4431-4441
Hauptverfasser: Jung, Lena, Hauer, Benedikt, Li, Peining, Bornhöfft, Manuel, Mayer, Joachim, Taubner, Thomas
Format: Artikel
Sprache:eng
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Zusammenfassung:We present a study on subsurface imaging with an infrared scattering-type scanning near-field optical microscope (s-SNOM). The depth-limitation for the visibility of gold nanoparticles with a diameter of 50 nm under Si N is determined to about 50 nm. We first investigate spot size and signal strength concerning their particle-size dependence for a dielectric cover layer with positive permittivity. The experimental results are confirmed by model calculations and a comparison to TEM images. In the next step, we investigate spectroscopically also the regime of negative permittivity of the capping layer and its influence on lateral resolution and signal strength in experiment and simulations. The explanation of this observation combines subsurface imaging and superlensing, and shows up limitations of the latter regarding small structure sizes.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.004431