Comparison of III-V/Si on-chip lasers with etched facet reflectors

Electrically pumped heterogeneously integrated III-V/SiO semiconductor on-chip lasers with different types of etched facet reflectors are designed and fabricated and their lasing performances are characterized and compared. The III-V quantum-well-based epitaxial layers are bonded on silica-on-silico...

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Veröffentlicht in:Applied Optics 2017-06, Vol.56 (17), p.5086-5091
Hauptverfasser: Lee, Chee-Wei, Ng, Doris Keh-Ting, Ren, Min, Fu, Yuan-Hsing, Seng Kay, Anthony Yew, Krishnamurthy, Vivek, Pu, Jing, Tan, Ai Ling, Choo, Soo Bin, Wang, Qian
Format: Artikel
Sprache:eng
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Zusammenfassung:Electrically pumped heterogeneously integrated III-V/SiO semiconductor on-chip lasers with different types of etched facet reflectors are designed and fabricated and their lasing performances are characterized and compared. The III-V quantum-well-based epitaxial layers are bonded on silica-on-silicon substrates and fabricated to form Fabry-Perot lasers with dry-etched rear facets. Three types of reflectors are demonstrated, which are etched facets terminated by air, benzocyclobutene, and metal with a thin layer of SiO insulator in-between. The laser devices are characterized and compared, including lasing threshold, external quantum efficiency, and output power, and show the impact of different types of etched facet reflectors on lasing performance.
ISSN:0003-6935
2155-3165
1539-4522
DOI:10.1364/AO.56.005086