Comparison of III-V/Si on-chip lasers with etched facet reflectors
Electrically pumped heterogeneously integrated III-V/SiO semiconductor on-chip lasers with different types of etched facet reflectors are designed and fabricated and their lasing performances are characterized and compared. The III-V quantum-well-based epitaxial layers are bonded on silica-on-silico...
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Veröffentlicht in: | Applied Optics 2017-06, Vol.56 (17), p.5086-5091 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Electrically pumped heterogeneously integrated III-V/SiO
semiconductor on-chip lasers with different types of etched facet reflectors are designed and fabricated and their lasing performances are characterized and compared. The III-V quantum-well-based epitaxial layers are bonded on silica-on-silicon substrates and fabricated to form Fabry-Perot lasers with dry-etched rear facets. Three types of reflectors are demonstrated, which are etched facets terminated by air, benzocyclobutene, and metal with a thin layer of SiO
insulator in-between. The laser devices are characterized and compared, including lasing threshold, external quantum efficiency, and output power, and show the impact of different types of etched facet reflectors on lasing performance. |
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ISSN: | 0003-6935 2155-3165 1539-4522 |
DOI: | 10.1364/AO.56.005086 |