Uniform emission, constant wavevector silicon grating surface emitter for beam steering with ultra-sharp instantaneous field-of-view

We report on uniform emission intensity profile, uniform propagation constant silicon gratings for beam steering application with ultra-sharp instantaneous field-of-view (IFOV). To achieve uniform emission intensity across relatively long emission length, we designed a custom grating with varying Si N width and duty cycle while maintaining a uniform propagation constant for relatively narrow divergence emission pattern. We designed and fabricated the custom Si N /Si grating with the varying Si N width/duty cycle together with the reference Si N /Si grating with a constant 50:50 duty cycle. The custom grating demonstrated the beam steering angle value of 6.6° by sweeping wavelength between 1530 nm and 1575 nm with the emission length over 1 mm. The measured IFOV based on the 3-dB beamwidth values of the far field patterns for the TE polarization are 0.10° and 0.75° for the custom grating and for the reference grating, respectively. The custom grating also indicates mode-selective behavior due to the perturbation of propagation constant for input modes other than TE polarization. The measured TE-mode to TM-mode suppression ratio for the custom grating is approximately 8.2 dB peak-to-peak measured at far field.