Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light‐emitting diode...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of Geophysical Research. E. Planets 2008-03, Vol.113 (E3), p.n/a
Hauptverfasser: Hecht, M. H., Marshall, J., Pike, W. T., Staufer, U., Blaney, D., Braendlin, D., Gautsch, S., Goetz, W., Hidber, H.-R., Keller, H. U., Markiewicz, W. J., Mazer, A., Meloy, T. P., Morookian, J. M., Mogensen, C., Parrat, D., Smith, P., Sykulska, H., Tanner, R. J., Reynolds, R. O., Tonin, A., Vijendran, S., Weilert, M., Woida, P. M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light‐emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet‐induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.
ISSN:0148-0227
2156-2202
DOI:10.1029/2008JE003077