Structural properties of Zn sub( 1-x)Mn sub( x)O films

In recent years dilute magnetic semiconductors have paid much attention due to their complementary properties of semiconductors and ferromagnetic behavior. Zn sub( 1-x)Mn sub( x)O thin films have been prepared by chemical spray pyrolysis at a deposition temperature of 400 degree C with different Mn compositions varied in the range, 0.0 less than or equal to x less than or equal to 0.25, on corning 7059 glass substrates. The as-grown layers were characterized to evaluate the compositional, structural properties. The change of dopants level in ZnO films with composition was analyzed using X-ray photoelectron spectroscope measurements. The X-ray diffraction studies revealed that all the films were strongly oriented along the (002) orientation corresponding to the hexagonal wurtzite structure. The FWHM, lattice parameters, stress and strain increased with Mn-doping.