Scanning near-field thermoelectric microscopy for subsurface nanoscale thermoelectric behavior

A novel scanning near-field thermoelectric microscopy (STeM) was proposed and developed for characterizing subsurface, nanoscale Seebeck coefficient of thermoelectric energy materials. In STeM, near-field evanescent thermal wave was induced around the thermal probe’s contact with the thermoelectric...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2016-05, Vol.122 (5), p.1-6, Article 521
Hauptverfasser: Xu, K. Q., Zeng, H. R., Zhao, K. Y., Li, G. R., Shi, X., Chen, L. D.
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Sprache:eng
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Zusammenfassung:A novel scanning near-field thermoelectric microscopy (STeM) was proposed and developed for characterizing subsurface, nanoscale Seebeck coefficient of thermoelectric energy materials. In STeM, near-field evanescent thermal wave was induced around the thermal probe’s contact with the thermoelectric sample’s surface via a periodically modulated heated thermal probe, giving rise to a thermoelectric near-field interaction with simultaneous excitation of three harmonic signals for local Seebeck coefficient derivation. The near-field STeM was capable of characterizing local Seebeck coefficient of thermoelectric materials with high lateral resolution at nanometer scale and more importantly provides a convenient, powerful tool for quantitative characterization of subsurface nanoscale thermoelectric properties.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-016-0050-7