Design and fabrication of transmission quarter phase retarder at wavelength 1064 nm, using optical nanometric thin films
We designed and fabricated the transmission quarter-wave plate phase retarder at 1064 nm using optical nanometric thin films of silicon oxide and titanium oxide. Final design consists of 32 layers. Transmissions of polarizations are equal and ≥99 % and their phase difference is 90°. System consists...
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| Veröffentlicht in: | Applied physics. B, Lasers and optics Lasers and optics, 2016-08, Vol.122 (8), p.1-8, Article 216 |
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| container_title | Applied physics. B, Lasers and optics |
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| creator | Moradi, Zahra Jahanshah, Fariborz Fallah, Hamid Reza Haji Mahmoodzade, Morteza Sahraee, Masoume Zabolian, Hosein |
| description | We designed and fabricated the transmission quarter-wave plate phase retarder at 1064 nm using optical nanometric thin films of silicon oxide and titanium oxide. Final design consists of 32 layers. Transmissions of polarizations are equal and ≥99 % and their phase difference is 90°. System consists of two 16 layers systems that coated with the same condition on BK7 glass substrates then attached together with optical glue. Electron beam evaporation method was used for depositing materials. Photo spectrometer was used for measuring transmission spectrum of system. Transmission of polarizations was ≥95 % and equal. A polarimeter was used for testing systems. Polarization of beam was circular. |
| doi_str_mv | 10.1007/s00340-016-6495-8 |
| format | Article |
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Final design consists of 32 layers. Transmissions of polarizations are equal and ≥99 % and their phase difference is 90°. System consists of two 16 layers systems that coated with the same condition on BK7 glass substrates then attached together with optical glue. Electron beam evaporation method was used for depositing materials. Photo spectrometer was used for measuring transmission spectrum of system. Transmission of polarizations was ≥95 % and equal. A polarimeter was used for testing systems. 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B, Lasers and optics</title><addtitle>Appl. Phys. B</addtitle><description>We designed and fabricated the transmission quarter-wave plate phase retarder at 1064 nm using optical nanometric thin films of silicon oxide and titanium oxide. Final design consists of 32 layers. Transmissions of polarizations are equal and ≥99 % and their phase difference is 90°. System consists of two 16 layers systems that coated with the same condition on BK7 glass substrates then attached together with optical glue. Electron beam evaporation method was used for depositing materials. Photo spectrometer was used for measuring transmission spectrum of system. Transmission of polarizations was ≥95 % and equal. A polarimeter was used for testing systems. 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B, Lasers and optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Moradi, Zahra</au><au>Jahanshah, Fariborz</au><au>Fallah, Hamid Reza</au><au>Haji Mahmoodzade, Morteza</au><au>Sahraee, Masoume</au><au>Zabolian, Hosein</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design and fabrication of transmission quarter phase retarder at wavelength 1064 nm, using optical nanometric thin films</atitle><jtitle>Applied physics. B, Lasers and optics</jtitle><stitle>Appl. Phys. B</stitle><date>2016-08-01</date><risdate>2016</risdate><volume>122</volume><issue>8</issue><spage>1</spage><epage>8</epage><pages>1-8</pages><artnum>216</artnum><issn>0946-2171</issn><eissn>1432-0649</eissn><abstract>We designed and fabricated the transmission quarter-wave plate phase retarder at 1064 nm using optical nanometric thin films of silicon oxide and titanium oxide. Final design consists of 32 layers. Transmissions of polarizations are equal and ≥99 % and their phase difference is 90°. System consists of two 16 layers systems that coated with the same condition on BK7 glass substrates then attached together with optical glue. Electron beam evaporation method was used for depositing materials. Photo spectrometer was used for measuring transmission spectrum of system. Transmission of polarizations was ≥95 % and equal. A polarimeter was used for testing systems. Polarization of beam was circular.</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s00340-016-6495-8</doi><tpages>8</tpages></addata></record> |
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| ispartof | Applied physics. B, Lasers and optics, 2016-08, Vol.122 (8), p.1-8, Article 216 |
| issn | 0946-2171 1432-0649 |
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| subjects | Applied physics Beams (radiation) Design engineering Electron beams Engineering Glass substrates Lasers Nanostructure Optical Devices Optics Phase shift Photonics Physical Chemistry Physics Physics and Astronomy Polarization Quantum Optics Retarders Silicon oxides Spectrometers Thin films Titanium oxides Wave plates |
| title | Design and fabrication of transmission quarter phase retarder at wavelength 1064 nm, using optical nanometric thin films |
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