Precise material identification method based on a photon counting technique with correction of the beam hardening effect in X-ray spectra

The aim of our study is to develop a novel material identification method based on a photon counting technique, in which the incident and penetrating X-ray spectra are analyzed. Dividing a 40 kV X-ray spectra into two energy regions, the corresponding linear attenuation coefficients are derived. We can identify the materials precisely using the relationship between atomic number and linear attenuation coefficient through the correction of the beam hardening effect of the X-ray spectra. •We propose a precise material identification method to be used as a photon counting system.•Beam hardening correction is important, even when the analysis is applied to the short energy regions in the X-ray spectrum.•Experiments using a single probe-type CdTe detector were performed, and Monte Carlo simulation was also carried out.•We described the applicability of our method for clinical diagnostic X-ray imaging in the near future.