XPS studies of thin polycyanurate films on silicon wafers

XPS studies of thin polycyanurate films on silicon wafers

Thin films of a diandicyanato bisphenol A (DCBA) prepolymer on silicon substrates have been investigated. Angle dependent X-ray photoelectron spectroscopy reveals some thickness-dependent features, which lead to an adsorption model for the DCBA prepolymer molecules. The adsorption of the first layer...

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Veröffentlicht in:Analytical and bioanalytical chemistry 1995-10, Vol.353 (3-4), p.278-281
Hauptverfasser: DIECKHOFF, S, SCHLETT, V, POSSART, W, HENNEMANN, O.-D
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Exact sciences and technology
Organic polymers
Physicochemistry of polymers
Properties and characterization
Surface properties
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Zusammenfassung:Thin films of a diandicyanato bisphenol A (DCBA) prepolymer on silicon substrates have been investigated. Angle dependent X-ray photoelectron spectroscopy reveals some thickness-dependent features, which lead to an adsorption model for the DCBA prepolymer molecules. The adsorption of the first layer is governed by the interaction of the triazine rings with the substrate surface.
ISSN:0937-0633
1432-1130
1618-2650
DOI:10.1007/BF00322052