DIFFRACTION ANOMALOUS FINE-STRUCTURE - A NEW X-RAY STRUCTURAL TECHNIQUE

A new x-ray structural technique, diffraction anomalous fine structure (DAFS), which combines the long-range order sensitivity of diffraction techniques with the short-range order sensitivity of absorption techniques, is described. We demonstrate that synchrotron DAFS measurements for the Cu(111) and Cu(222) Bragg reflections provide the same local atomic structural information as x-ray absorption fine structure and describe how DAFS can be used to provide enhanced site and spatial sensitivities for polyatomic and/or spatially modulated structures.