Structural characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy

Structural characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy

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Veröffentlicht in:Physical review letters 1988-11, Vol.61 (19), p.2274-2274
Hauptverfasser: Tromp, RM, LeGoues, FK, Krakow, W, Schowalter, LJ
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container_issue 19
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container_title Physical review letters
container_volume 61
creator Tromp, RM
LeGoues, FK
Krakow, W
Schowalter, LJ
description
doi_str_mv 10.1103/PhysRevLett.61.2274
format Article
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title Structural characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy
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