Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions

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Bibliographische Detailangaben
Veröffentlicht in:	Physical review letters 1989-10, Vol.63 (15), p.1625-1628
Hauptverfasser:	BLAIN, M. G, DELLA-NEGRA, S, JORET, H, LE BEYEC, Y, SCHWEIKERT, E. A
Format:	Artikel
Sprache:	eng
Schlagworte:	Analysing. Testing. Standards Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Materials science Measurement of properties and materials state Metals, semimetals and alloys Metals. Metallurgy Nondestructive testing Other electron-impact emission phenomena Physics Specific materials
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