Vibrational spectrum of amorphous silicon: experiment and computer simulation

The dynamical structure factor S(Q,..omega..) and the vibrational density of states g(..omega..) for amorphous silicon have been measured by neutron scattering methods. Computer simulations of S(Q,..omega..), based on a 216-atom structural model, are in substantial agreement with experiment.

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Bibliographische Detailangaben
Veröffentlicht in:	Phys. Rev. B: Condens. Matter; (United States) 1987-10, Vol.36 (12), p.6539-6542
Hauptverfasser:	KAMITAKAHARA, W. A, SOUKOULIS, C. M, SHANKS, H. R, BUCHENAU, U, GREST, G. S
Format:	Artikel
Sprache:	eng
Schlagworte:	360603 - Materials- Properties AMORPHOUS STATE COHERENT SCATTERING Condensed matter: structure, mechanical and thermal properties DIFFRACTION ELEMENTS ENERGY LEVELS ENERGY-LEVEL DENSITY Exact sciences and technology EXCITED STATES Lattice dynamics MATERIALS SCIENCE NEUTRON DIFFRACTION Phonon states and bands, normal modes, and phonon dispersion PHONONS Phonons and vibrations in crystal lattices Physics QUASI PARTICLES SCATTERING SEMIMETALS SILICON SOLIDS STRUCTURE FACTORS VIBRATIONAL STATES
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Beschreibung
Zusammenfassung:	The dynamical structure factor S(Q,..omega..) and the vibrational density of states g(..omega..) for amorphous silicon have been measured by neutron scattering methods. Computer simulations of S(Q,..omega..), based on a 216-atom structural model, are in substantial agreement with experiment.
ISSN:	0163-1829 1095-3795
DOI:	10.1103/physrevb.36.6539