Faceting, roughness, and step disordering of vicinal Si(111) surfaces : an x-ray-scattering study
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| Veröffentlicht in: | Physical review. B, Condensed matter Condensed matter, 1993-07, Vol.48 (3), p.1612-1625 |
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| container_end_page | 1625 |
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| container_issue | 3 |
| container_start_page | 1612 |
| container_title | Physical review. B, Condensed matter |
| container_volume | 48 |
| creator | NOH, D. Y BLUM, K. I RAMSTAD, M. J BIRGENEAU, R. J |
| description | |
| doi_str_mv | 10.1103/PhysRevB.48.1612 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0163-1829 |
| ispartof | Physical review. B, Condensed matter, 1993-07, Vol.48 (3), p.1612-1625 |
| issn | 0163-1829 1095-3795 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1859207056 |
| source | American Physical Society Journals |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray absorption spectroscopy: exafs, nexafs, xanes, etc X-ray diffraction and scattering |
| title | Faceting, roughness, and step disordering of vicinal Si(111) surfaces : an x-ray-scattering study |
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