Faceting, roughness, and step disordering of vicinal Si(111) surfaces : an x-ray-scattering study

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Veröffentlicht in:	Physical review. B, Condensed matter Condensed matter, 1993-07, Vol.48 (3), p.1612-1625
Hauptverfasser:	NOH, D. Y, BLUM, K. I, RAMSTAD, M. J, BIRGENEAU, R. J
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray absorption spectroscopy: exafs, nexafs, xanes, etc X-ray diffraction and scattering
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