CIDRE: an illumination-correction method for optical microscopy

A retrospective method to correct for uneven illumination in microscopy is reported in this paper. Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.