Quasi-two-dimensional β-gallium oxide solar-blind photodetectors with ultrahigh responsivity

Solar-blind photodetectors have received a great deal of interest owing to their high selectivity for deep ultra-violet light in the presence of visible light. The development of alternative materials and innovative device designs are necessary for such solar-blind photodetectors, as the currently a...

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Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2016, Vol.4 (39), p.9245-925
Hauptverfasser: Oh, Sooyeoun, Kim, Janghyuk, Ren, Fan, Pearton, Stephen J, Kim, Jihyun
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Sprache:eng
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Zusammenfassung:Solar-blind photodetectors have received a great deal of interest owing to their high selectivity for deep ultra-violet light in the presence of visible light. The development of alternative materials and innovative device designs are necessary for such solar-blind photodetectors, as the currently available commercial devices have issues pertaining to chemical and thermal instability, cost, and material handling due to their rigidity. Here, we fabricated solar-blind photodetectors based on exfoliated quasi-two-dimensional β-Ga 2 O 3 flakes with optimal opto-electrical properties (direct bandgap of ∼4.9 eV), chemical and thermal stability, and then systematically characterized their photoresponsive properties. The fabricated device structures were based on back-gated field-effect transistors, allowing us to control the dark currents. These photodetectors exhibit extraordinary photoresponsive properties including the highest responsivity (1.8 × 10 5 A W −1 ) among reported semiconductor thin-film solar-blind photodetectors. We fabricated solar-blind photodetectors based on exfoliated two-dimensional β-Ga 2 O 3 flakes, and then systematically characterized their photoresponsive properties. They exhibit extraordinary photoresponsive properties including the highest responsivity among reported semiconductor thin-film solar-blind photodetectors.
ISSN:2050-7526
2050-7534
DOI:10.1039/c6tc02467j