Screening of metal flux for SiC solution growth by a thin-film combinatorial method

4H-SiC is a wide-bandgap semiconductor with potential applications in power devices. The lack of a liquid phase in SiC hinders conventional crystal growth from the melt; consequently, SiC wafers still have low quality and are nearly 100 times more expensive than Si wafers. To take advantage of the s...

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Veröffentlicht in:Science and technology of advanced materials 2011-10, Vol.12 (5), p.054209-054209
Hauptverfasser: Yonezawa, Yoshiyuki, Ryo, Mina, Takigawa, Aki, Matsumoto, Yuji
Format: Artikel
Sprache:eng
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Zusammenfassung:4H-SiC is a wide-bandgap semiconductor with potential applications in power devices. The lack of a liquid phase in SiC hinders conventional crystal growth from the melt; consequently, SiC wafers still have low quality and are nearly 100 times more expensive than Si wafers. To take advantage of the solution growth for improving the quality and reducing the cost of SiC, Ni addition to Si-Ti flux has been investigated. A combinatorial approach was employed to accelerate the screening of metal flux for the SiC solution growth.
ISSN:1468-6996
1878-5514
DOI:10.1088/1468-6996/12/5/054209