Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO
This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified thr...
Gespeichert in:
| Veröffentlicht in: | IEICE Transactions on Electronics 2016/06/01, Vol.E99.C(6), pp.659-662 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 662 |
|---|---|
| container_issue | 6 |
| container_start_page | 659 |
| container_title | IEICE Transactions on Electronics |
| container_volume | E99.C |
| creator | KADOMOTO, Junichiro HASEGAWA, So KIUCHI, Yusuke KOSUGE, Atsutake KURODA, Tadahiro |
| description | This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification. |
| doi_str_mv | 10.1587/transele.E99.C.659 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1825541062</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1825541062</sourcerecordid><originalsourceid>FETCH-LOGICAL-c512t-68b547d4a1fdad545346be1d0ae02a590d833439f829cd7874e8614995122ac3</originalsourceid><addsrcrecordid>eNpdkEFPwjAYhhujiYj-AU87ehm2a7utR7KgkJBwId5M89F9g5HRYVs0_HtLQE08fYf3fd7kewh5ZHTEZFk8BwfWY4ejiVKjapRLdUUGrBAyZVzyazKgiuVpKTNxS-6831LKyozxAXkfW-iOvvUJ2DqZfEJ3gND2NumbZNKhCa7fwdpiaE0yswFdgw6twWSF4QvRJsuNO1Sbdn9JIUanpXmVvlWLe3LTQOfx4XKHZPkyWVbTdL54nVXjeWoky0KalyspiloAa2qopZBc5CtkNQWkGUhF65JzwVVTZsrURVkILHMmlIp0BoYPydN5du_6jwP6oHetN9h1YLE_eB1_lVIwmmexmp2rxvXeO2z03rU7cEfNqD6p1D8qdVSpKx1VRmh6hrY-wBp_EXBRS2z-R_7Q34rZgNNo-TcYLoRE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1825541062</pqid></control><display><type>article</type><title>Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO</title><source>J-STAGE Free</source><creator>KADOMOTO, Junichiro ; HASEGAWA, So ; KIUCHI, Yusuke ; KOSUGE, Atsutake ; KURODA, Tadahiro</creator><creatorcontrib>KADOMOTO, Junichiro ; HASEGAWA, So ; KIUCHI, Yusuke ; KOSUGE, Atsutake ; KURODA, Tadahiro</creatorcontrib><description>This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.</description><identifier>ISSN: 0916-8524</identifier><identifier>EISSN: 1745-1353</identifier><identifier>DOI: 10.1587/transele.E99.C.659</identifier><language>eng</language><publisher>The Institute of Electronics, Information and Communication Engineers</publisher><subject>3D integration ; Channels ; Design analysis ; Design engineering ; Electromagnetic interference ; Electronics ; EMI ; Guidelines ; High speed ; LC-VCO ; TCI</subject><ispartof>IEICE Transactions on Electronics, 2016/06/01, Vol.E99.C(6), pp.659-662</ispartof><rights>2016 The Institute of Electronics, Information and Communication Engineers</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c512t-68b547d4a1fdad545346be1d0ae02a590d833439f829cd7874e8614995122ac3</citedby><cites>FETCH-LOGICAL-c512t-68b547d4a1fdad545346be1d0ae02a590d833439f829cd7874e8614995122ac3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,1879,27907,27908</link.rule.ids></links><search><creatorcontrib>KADOMOTO, Junichiro</creatorcontrib><creatorcontrib>HASEGAWA, So</creatorcontrib><creatorcontrib>KIUCHI, Yusuke</creatorcontrib><creatorcontrib>KOSUGE, Atsutake</creatorcontrib><creatorcontrib>KURODA, Tadahiro</creatorcontrib><title>Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO</title><title>IEICE Transactions on Electronics</title><addtitle>IEICE Trans. Electron.</addtitle><description>This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.</description><subject>3D integration</subject><subject>Channels</subject><subject>Design analysis</subject><subject>Design engineering</subject><subject>Electromagnetic interference</subject><subject>Electronics</subject><subject>EMI</subject><subject>Guidelines</subject><subject>High speed</subject><subject>LC-VCO</subject><subject>TCI</subject><issn>0916-8524</issn><issn>1745-1353</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNpdkEFPwjAYhhujiYj-AU87ehm2a7utR7KgkJBwId5M89F9g5HRYVs0_HtLQE08fYf3fd7kewh5ZHTEZFk8BwfWY4ejiVKjapRLdUUGrBAyZVzyazKgiuVpKTNxS-6831LKyozxAXkfW-iOvvUJ2DqZfEJ3gND2NumbZNKhCa7fwdpiaE0yswFdgw6twWSF4QvRJsuNO1Sbdn9JIUanpXmVvlWLe3LTQOfx4XKHZPkyWVbTdL54nVXjeWoky0KalyspiloAa2qopZBc5CtkNQWkGUhF65JzwVVTZsrURVkILHMmlIp0BoYPydN5du_6jwP6oHetN9h1YLE_eB1_lVIwmmexmp2rxvXeO2z03rU7cEfNqD6p1D8qdVSpKx1VRmh6hrY-wBp_EXBRS2z-R_7Q34rZgNNo-TcYLoRE</recordid><startdate>20160601</startdate><enddate>20160601</enddate><creator>KADOMOTO, Junichiro</creator><creator>HASEGAWA, So</creator><creator>KIUCHI, Yusuke</creator><creator>KOSUGE, Atsutake</creator><creator>KURODA, Tadahiro</creator><general>The Institute of Electronics, Information and Communication Engineers</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20160601</creationdate><title>Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO</title><author>KADOMOTO, Junichiro ; HASEGAWA, So ; KIUCHI, Yusuke ; KOSUGE, Atsutake ; KURODA, Tadahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c512t-68b547d4a1fdad545346be1d0ae02a590d833439f829cd7874e8614995122ac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>3D integration</topic><topic>Channels</topic><topic>Design analysis</topic><topic>Design engineering</topic><topic>Electromagnetic interference</topic><topic>Electronics</topic><topic>EMI</topic><topic>Guidelines</topic><topic>High speed</topic><topic>LC-VCO</topic><topic>TCI</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KADOMOTO, Junichiro</creatorcontrib><creatorcontrib>HASEGAWA, So</creatorcontrib><creatorcontrib>KIUCHI, Yusuke</creatorcontrib><creatorcontrib>KOSUGE, Atsutake</creatorcontrib><creatorcontrib>KURODA, Tadahiro</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEICE Transactions on Electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KADOMOTO, Junichiro</au><au>HASEGAWA, So</au><au>KIUCHI, Yusuke</au><au>KOSUGE, Atsutake</au><au>KURODA, Tadahiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO</atitle><jtitle>IEICE Transactions on Electronics</jtitle><addtitle>IEICE Trans. Electron.</addtitle><date>2016-06-01</date><risdate>2016</risdate><volume>E99.C</volume><issue>6</issue><spage>659</spage><epage>662</epage><pages>659-662</pages><issn>0916-8524</issn><eissn>1745-1353</eissn><abstract>This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.</abstract><pub>The Institute of Electronics, Information and Communication Engineers</pub><doi>10.1587/transele.E99.C.659</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0916-8524 |
| ispartof | IEICE Transactions on Electronics, 2016/06/01, Vol.E99.C(6), pp.659-662 |
| issn | 0916-8524 1745-1353 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1825541062 |
| source | J-STAGE Free |
| subjects | 3D integration Channels Design analysis Design engineering Electromagnetic interference Electronics EMI Guidelines High speed LC-VCO TCI |
| title | Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T11%3A46%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20and%20Evaluation%20of%20Electromagnetic%20Interference%20between%20ThruChip%20Interface%20and%20LC-VCO&rft.jtitle=IEICE%20Transactions%20on%20Electronics&rft.au=KADOMOTO,%20Junichiro&rft.date=2016-06-01&rft.volume=E99.C&rft.issue=6&rft.spage=659&rft.epage=662&rft.pages=659-662&rft.issn=0916-8524&rft.eissn=1745-1353&rft_id=info:doi/10.1587/transele.E99.C.659&rft_dat=%3Cproquest_cross%3E1825541062%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1825541062&rft_id=info:pmid/&rfr_iscdi=true |