Nanoscale 2013
The accurate determination of the properties of micro- and nano-structures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. In most cases, especially at the nanometer range, knowledge of the dimensional properties of structures...
Gespeichert in:
Veröffentlicht in: | Measurement science & technology 2014-04, Vol.25 (4), p.40301-2 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2 |
---|---|
container_issue | 4 |
container_start_page | 40301 |
container_title | Measurement science & technology |
container_volume | 25 |
creator | Koenders, Ludger Ducourtieux, Sebastien |
description | The accurate determination of the properties of micro- and nano-structures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. In most cases, especially at the nanometer range, knowledge of the dimensional properties of structures is the fundamental base, to which further physical properties are linked. Quantitative measurements presuppose reliable and stable instruments, suitable measurement procedures as well as calibration artifacts and methods. |
doi_str_mv | 10.1088/0957-0233/25/4/040301 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1825527776</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1825527776</sourcerecordid><originalsourceid>FETCH-LOGICAL-c201t-cc514ad3a4cccebb966004e2388d6f260169e6210495d3cd1e43fb3152b5dce83</originalsourceid><addsrcrecordid>eNo9z01Lw0AQxvFFFIxVv4Hg0UvMzM7OZvcoxTcoetHzstlMoJI2Ndse_PY2RDw9lx8P_JW6QbhHcK4Cz3UJmqjSXJkKDBDgiSqQLJaWAU9V8W_O1UXOXwBQg_eFun6L2yGn2MutBqRLddbFPsvV3y7U59Pjx_KlXL0_vy4fVmU6qn2ZEqOJLUWTUpKm8dYCGNHkXGs7bQGtF6sRjOeWUotiqGsIWTfcJnG0UHfz724cvg-S92Gzzkn6Pm5lOOSATjPruq7tkfJM0zjkPEoXduN6E8efgBCm_jC1haktaA4mzP30C1OnSlE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1825527776</pqid></control><display><type>article</type><title>Nanoscale 2013</title><source>Institute of Physics Journals</source><creator>Koenders, Ludger ; Ducourtieux, Sebastien</creator><creatorcontrib>Koenders, Ludger ; Ducourtieux, Sebastien</creatorcontrib><description>The accurate determination of the properties of micro- and nano-structures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. In most cases, especially at the nanometer range, knowledge of the dimensional properties of structures is the fundamental base, to which further physical properties are linked. Quantitative measurements presuppose reliable and stable instruments, suitable measurement procedures as well as calibration artifacts and methods.</description><identifier>ISSN: 0957-0233</identifier><identifier>EISSN: 1361-6501</identifier><identifier>DOI: 10.1088/0957-0233/25/4/040301</identifier><language>eng</language><subject>Calibration ; Nanostructure ; Physical properties ; Process control ; Quality assurance ; Research and development</subject><ispartof>Measurement science & technology, 2014-04, Vol.25 (4), p.40301-2</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c201t-cc514ad3a4cccebb966004e2388d6f260169e6210495d3cd1e43fb3152b5dce83</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Koenders, Ludger</creatorcontrib><creatorcontrib>Ducourtieux, Sebastien</creatorcontrib><title>Nanoscale 2013</title><title>Measurement science & technology</title><description>The accurate determination of the properties of micro- and nano-structures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. In most cases, especially at the nanometer range, knowledge of the dimensional properties of structures is the fundamental base, to which further physical properties are linked. Quantitative measurements presuppose reliable and stable instruments, suitable measurement procedures as well as calibration artifacts and methods.</description><subject>Calibration</subject><subject>Nanostructure</subject><subject>Physical properties</subject><subject>Process control</subject><subject>Quality assurance</subject><subject>Research and development</subject><issn>0957-0233</issn><issn>1361-6501</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNo9z01Lw0AQxvFFFIxVv4Hg0UvMzM7OZvcoxTcoetHzstlMoJI2Ndse_PY2RDw9lx8P_JW6QbhHcK4Cz3UJmqjSXJkKDBDgiSqQLJaWAU9V8W_O1UXOXwBQg_eFun6L2yGn2MutBqRLddbFPsvV3y7U59Pjx_KlXL0_vy4fVmU6qn2ZEqOJLUWTUpKm8dYCGNHkXGs7bQGtF6sRjOeWUotiqGsIWTfcJnG0UHfz724cvg-S92Gzzkn6Pm5lOOSATjPruq7tkfJM0zjkPEoXduN6E8efgBCm_jC1haktaA4mzP30C1OnSlE</recordid><startdate>20140401</startdate><enddate>20140401</enddate><creator>Koenders, Ludger</creator><creator>Ducourtieux, Sebastien</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20140401</creationdate><title>Nanoscale 2013</title><author>Koenders, Ludger ; Ducourtieux, Sebastien</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c201t-cc514ad3a4cccebb966004e2388d6f260169e6210495d3cd1e43fb3152b5dce83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Calibration</topic><topic>Nanostructure</topic><topic>Physical properties</topic><topic>Process control</topic><topic>Quality assurance</topic><topic>Research and development</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Koenders, Ludger</creatorcontrib><creatorcontrib>Ducourtieux, Sebastien</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Measurement science & technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Koenders, Ludger</au><au>Ducourtieux, Sebastien</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nanoscale 2013</atitle><jtitle>Measurement science & technology</jtitle><date>2014-04-01</date><risdate>2014</risdate><volume>25</volume><issue>4</issue><spage>40301</spage><epage>2</epage><pages>40301-2</pages><issn>0957-0233</issn><eissn>1361-6501</eissn><abstract>The accurate determination of the properties of micro- and nano-structures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. In most cases, especially at the nanometer range, knowledge of the dimensional properties of structures is the fundamental base, to which further physical properties are linked. Quantitative measurements presuppose reliable and stable instruments, suitable measurement procedures as well as calibration artifacts and methods.</abstract><doi>10.1088/0957-0233/25/4/040301</doi><tpages>2</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0957-0233 |
ispartof | Measurement science & technology, 2014-04, Vol.25 (4), p.40301-2 |
issn | 0957-0233 1361-6501 |
language | eng |
recordid | cdi_proquest_miscellaneous_1825527776 |
source | Institute of Physics Journals |
subjects | Calibration Nanostructure Physical properties Process control Quality assurance Research and development |
title | Nanoscale 2013 |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T01%3A16%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nanoscale%202013&rft.jtitle=Measurement%20science%20&%20technology&rft.au=Koenders,%20Ludger&rft.date=2014-04-01&rft.volume=25&rft.issue=4&rft.spage=40301&rft.epage=2&rft.pages=40301-2&rft.issn=0957-0233&rft.eissn=1361-6501&rft_id=info:doi/10.1088/0957-0233/25/4/040301&rft_dat=%3Cproquest_cross%3E1825527776%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1825527776&rft_id=info:pmid/&rfr_iscdi=true |